High resolution deep level transient spectroscopy (Laplace DLTS)

High resolution deep level transient spectroscopy (Laplace DLTS)

  • Skraćeni naziv instrumenta

    Laplace DLTS

    Inventarni broj

    TBC

    Opći opis

    Electrical characterization of deep level defects in semiconductors.

    Uža područja primjene

    Semiconductors

    Year of manufacture

    2017

  • Ustanova en

    Institut Ruđer Bošković
    Bijenička cesta 54, Zagreb

  • Način korištenja instrumenta

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  • Slike en

Natrag en