Keithley 4200-SCS Semiconductor Characterization System

Keithley 4200-SCS Semiconductor Characterization System
  • Skraćeni naziv instrumenta

    SCS

    Project title

    e-SiCure

    Procijenjeni broj korisnika

    10

    Year of manufacture

    2016

  • Ustanova en

    Institut Ruđer Bošković
    Bijenička cesta 54, Zagreb

    Zavod

    Division of materil physics

    Laboratorij

    lab for semiconductors

  • Način korištenja instrumenta

    , , , ,

  • Mrežna (URL) adresa instrumenta na stranicama proizvođača

    www.tek.com

    Purchase price

    224

  • Slike en
    Model 4200
    Model 4200

Natrag en