The atomic force microscope (AFM) scans the surface of a sample by measuring the interaction between the sharp tip attached to the flexible cantilever and the sample. AFM device consists of three main parts: piezoelectric scanner, scanning probe and system for detecting movement of the cantilever. The probe consists of a cantilever with a tip (SiN3, SiO2, carbon nanotube).
Characteristics:
-surface imaging in 3D at the subnanometre resolution (0.1 nm vertical, >1 nm lateral)
-non-destructive method
-the sample is in the native form in air or in liquid
-measurement of intra- and inter-molecular forces, viscoelastic and other mechanical properties
-suitable for macromolecules, polymers, vesicles, liquid crystals, colloids, cells and cell organelles, abiotic particles in natural conditions, different solid samples
