Gaertner Scientific L116B Ellipsometer

Gaertner Scientific L116B Ellipsometer
  • Skraćeni naziv instrumenta

    Ellipsometer L116B

    Opći opis

    The L116B makes possible fast measurements of film thickness and film refractive index. The variable angle capability gives refractive index measurements over a wider thickness range.

    Year of manufacture

    2017

  • Ustanova en

    Sveučilište u Zagrebu, Prirodoslovno-matematički fakultet
    , Zagreb

  • Slike en
    L116B
    L116B

Natrag en