Scanning ečectron microscope Tescan Vega III Easyprobe
Skraćeni naziv instrumenta
SEM
Inventarni broj
13788
Opći opis
Scanning electron microscope with wolfram electron source and EDS detector for elemental analysis. Suitable for analysis of various solid samples of smaller dimensions (at most several centimeters in diameter). Nonconductive samples have to be coated with a conductive layer (sputter coater is available).
Uža područja primjene
materials science, chemical engineering
Namjena instrumenta
obtaining information on microstructure: morphology and dimensions, as well as elemental composition of the sample
Popis usluga
imaging of samples; EDS analysis of sample composition
Ključne riječi
microstructure, EDS analysis
Procijenjeni broj korisnika
20
Year of manufacture
2013
Ustanova en
Sveučilište u Zagrebu, Fakultet kemijskog inženjerstva i tehnologije Marulićev trg 19, Zagreb
Zavod
Department of physical chemistry
Laboratorij
Electron microscopy laboratory
Grad
Zagreb
Ulica i broj
Marulićev trg 20
Krilo/Kat/Soba
1st floor
Način korištenja instrumenta
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Upute za korisnike
Please contact the person in charge: prof. Jelena Macan
Broj istovrsnih instrumenata u ustanovi
1
Servis uz naplatu
,
Ime i prezime
Jelena Macan
Titula
prof.
E-mail
jmacan@fkit.hr
Telefon
+385-1-4597-236
Model
Tescan Vega III Easyprobe
Mrežna (URL) adresa instrumenta na stranicama proizvođača
Instrument description