Scanning electron microscope

  • Skraćeni naziv instrumenta

    SEM

    Opći opis

    TESCAN VEGA TS5136LS
    A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.

    Uža područja primjene

    Materiallography, materials characterisation

    Namjena instrumenta

    Microstructure analysis

    Popis usluga

    Microstructure analysis

    Opis na stranicama zavoda/laboratorija

    https://www.fsb.unizg.hr/usb_frontend/?site_id=106/

    Ključne riječi

    SEM, microstructure analysis

    Procijenjeni broj korisnika

    2

    Year of manufacture

    2003

  • Ustanova en

    Sveučilište u Zagrebu, Fakultet strojarstva i brodogradnje
    Ivana Lučića 5, Zagreb

  • Cjenik korištenja

    SEM, microstructure analysis

    Popis ovlaštenih korisnika

    FAMENA

  • Ime i prezime

    Zdravko Schauperl

    Titula

    prof.

    E-mail

    zdravko.schauperl@fsb.hr

    Telefon

    00385 1 6168581

  • Model

    TESCAN VEGA TS5136LS

    Proizvođač

    TESCAN

    Purchase price

    750000

  • Slike en
    SCANNING ELECTRON MICROSCOPE TESCAN VEGA TS5136LS WITH EDS
    SCANNING ELECTRON MICROSCOPE TESCAN VEGA TS5136LS WITH EDS

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