Spectroscopic imaging ellipsometer

Spectroscopic imaging ellipsometer

  • Skraćeni naziv instrumenta

    Spectroscopic imaging ellipsometer

    Inventarni broj

    4029

    Opći opis

    Spectroscopic ellipsometry is a well-known non-destructive optical method for determining the thickness and opto-electronic properties of thin films.
    Imaging ellipsometry combines the power of ellipsometry with microscopy and overcomes the limits of classical ellipsometers

    Uža područja primjene

    Material science, physics, electronics, optics, physical chemistry

    Namjena instrumenta

    Thin film characterization, measurement of the optical properties of thin film materials

    Popis usluga

    Measurement of thickness and dielectric function of thin films, dielectric constant imaging, surface plasmon resonance with lateral resolution of 2 um, Brewster angle microscopy

    Opis na stranicama zavoda/laboratorija

    http://cmnzt.uniri.hr/lcpi/

    Tijelo koje je financiralo nabavku opreme

    ,

    Project title

    RISK - Research Infrastructure for Campus-based Laboratories at the University of Rijeka (grant number RC.2.2.06-0001)

    Ključne riječi

    spectroscopic ellipsometry, microscope, dielectric function, thin film, refractive index, thickness

    Procijenjeni broj korisnika

    3

    Year of manufacture

    2014

  • Ustanova en

    Sveučilište u Rijeci, Centar za mikro- i nanoznanosti i tehnologije
    Radmile Matejčić 2, Rijeka

    Laboratorij

    Laboratory for colloids, polyelectroytes and interfaces

    Grad

    Rijeka

    Ulica i broj

    Radmile Matejčić 2

    Krilo/Kat/Soba

    1

  • Način korištenja instrumenta

    ,

    Upute za korisnike

    For more information please contact Dr. Duško Čakara (dcakara@uniri.hr)

    Cjenik korištenja

    445,52 Kn / hour

    Popis ovlaštenih korisnika

    Dr. Duško Čakara, ass. prof.

  • Ime i prezime

    Čakara

    Titula

    DSc

    E-mail

    dcakara@uniri.hr

    Telefon

    051 584555

    Mobitel

    091 9570 399

  • Model

    Accurion EP4

    Mrežna (URL) adresa instrumenta na stranicama proizvođača

    https://www.accurion.com/thin-film-characterization-imaging-ellipsometry

    Princip rada i mjerna tehnika

    The modularity of the Accurion EP4 Imaging Ellipsometer offers many advantages:
    Spectroscopic ellipsometry with highest lateral resolution (2μm) – mapping
    the dielectric function; 3D thickness maps. The EP4 model software
    enables fitting the thicknesses and iso- or anisotropic dielectric functions
    for stacked layers of different optical materials. The solid-liquid and electrochemical
    cells enable measurements in contact with liquid medium,
    and under electrochemical bias (in combination with potentiostat Autolab
    PGTSAT 128 N). Brewster angle microscopy - a high contrast image of
    liquid surfaces without use of dies. Surface plasmon resonance measurements
    with lateral resolution of 2μm. Typical applications are in the triangle
    between physics and biophysics, material chemistry and nanotechnology.

    Radno i mjerno područje

    300-1700 nm

    Proizvođač

    Accurion GmbH

    Purchase price

    2

    Estimated current value of equipment

    893

    Vijek trajanja

    5 godina

  • Slike en
    Spectroscopic imaging ellipsometer Accurion EP4
    Spectroscopic imaging ellipsometer Accurion EP4
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