Bruker Dimension Icon Scanning Probe Microscope (SPM)

Bruker Dimension Icon Scanning Probe Microscope (SPM)
  • Skraćeni naziv instrumenta

    SPM

    Inventarni broj

    4042

    Project title

    Research Infrastructure for Campus-based Laboratories at the University of Rijeka

    Ključne riječi

    Scanning Probe Microscope, Atomic Force Microscope, Scanning Tunneling Microscope

  • Ustanova en

    Sveučilište u Rijeci, Centar za mikro- i nanoznanosti i tehnologije
    Radmile Matejčić 2, Rijeka

    Laboratorij

    Laboratory for precision engineering and micro- and nanosystems technologies

    Grad

    Rijeka

    Ulica i broj

    Radmile Matejcic 2

    Krilo/Kat/Soba

    Zgrada odjela/Suteren/O-S23

  • Način korištenja instrumenta

    , ,

  • Ime i prezime

    Ervin Kamenar

    Titula

    D. Sc.

    E-mail

    ekamenar@riteh.hr

    Telefon

    +385 51 651 585

  • Ime i prezime

    Sasa Zelenika

    Titula

    Prof. D. Sc.

    E-mail

    sasa.zelenika@riteh.hr

    Telefon

    +385 51 651 538

  • Model

    Bruker Dimension Icon

    Mrežna (URL) adresa instrumenta na stranicama proizvođača

    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon/overview.html

    Princip rada i mjerna tehnika

    Enables measurements of elasticity modulus, adhesion, lateral force (LFM), spectroscopy and force modulation, electrochemical analysis, electric field and magnetic forces, surface potential, piezoelectric force; enables also nanolithography, … Option to measure in liquid for biotechnical applications and measurements with heating/cooling of the samples, …

    Proizvođač

    Bruker

    Mrežna (URL) adresa proizvođača

    https://www.bruker.com

    Detaljne tehničke karakteristike

    - Supports contact and tapping mode measurements, which limits the contact forces to < 200 pN, i.e. a value far lower than the tapping forces of other devices – PeakForce tapping
    - Imaging of measured data on 5’120 x 5’120 pixels.
    - Scan range up to 90 µm x 90 µm, Z range 10 µm
    - Samples fixed to the support via a 210 mm vacuum chuck can be up to few mm in size and 15 mm thick
    - Bidirectional positioning repeatability 3 µm on 180 x 150 mm inspectable area
    - Includes heat (creep < 200 pm/min) and vibration isolation (1” Si damping cushion + compressed air → < 30 pm RMS), microscope and 5 Mpx CCD camera, …
    - CE certified

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    Scanning Probe Microscope (SPM)
    Scanning Probe Microscope (SPM)
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