Field Emission Scanning Electron Microscope, JSM 7000F

Field Emission Scanning Electron Microscope, JSM 7000F

  • Skraćeni naziv instrumenta

    FE SEM

    Opći opis

    Field Emission Scanning Electron Microscope (FE SEM) is an analytical instrument that provide the high resolution images of the sample surface by scanning it with a focused beam of electrons.

    Uža područja primjene

    Materials science, nanomaterials, metalurgy, geology

    Popis usluga

    materials science, nanomaterials, metalurgy, geology

    Opis na stranicama zavoda/laboratorija

    http://www.irb.hr/eng/Research/Divisions-and-Centers/Division-of-Materials-Chemistry/Laboratory-for-Synthesis-of-New-Materials

    Project title

    Synthesis and microstructure of metal oxides and oxide glasses

    Ključne riječi

    FE SEM, EDS, scanning electron microscopy

    Year of manufacture

    2005

  • Ustanova en

    Institut Ruđer Bošković
    Bijenička cesta 54, Zagreb

    Zavod

    Division of Materials Chemistry

    Laboratorij

    LSNM

    Grad

    Zagreb

    Ulica i broj

    Bijenička cesta 54

    Krilo/Kat/Soba

    X/suteren/002A

  • Način korištenja instrumenta

    ,

    Cjenik korištenja

    RBI users:
    FE SEM imiging:130 kn / h
    FE SEM imiging and microanalysis:177.73 kn / h

    Users from the academic institutions of RH:
    FE SEM imiging: 382,01 kn/h + VAT
    FE SEM imiging and microanalysis: 439,61 kn/h + VAT

    Users from industry and enterprises:
    FE SEM imiging: 1.217,72 kn/h + VAT
    FE SEM imiging and microanalysis: 1.468,18 kn/h + VAT

    Popis ovlaštenih korisnika

    Dr. Josip Bronić (bronic@irb.hr)
    Prof. Marijan Marciuš (mmarcius@irb.hr)
    Dr. Željka Petrović (zpetrov@irb.hr)
    Dr. Stjepko Krehula (krehul@irb.hr)

    Termini tečajeva za korisnike

    once per year

    Broj istovrsnih instrumenata u ustanovi

    1

  • Opis tržišne prilike

    -analysis of chemical composition (EDS) and morphology of stable particles of micro- and nanometer size
    semiconductor industry
    -ecology
    -mineralogy
    -metallurgy

    Opis usluge

    FE SEM and elemental analysis

  • Ime i prezime

    Marijan Marciuš

    E-mail

    mmarcius@irb.hr

  • Model

    Jeol, JSM 7000F

    Mrežna (URL) adresa instrumenta na stranicama proizvođača

    http://www.jeol.co.jp/en/products/list_sem.html

    Princip rada i mjerna tehnika

    Interaction of a focused electrons beam with the investigated speicmen produce various signals that are used to study the specimen's microtopography and chemical composition. The most frequently secondary electrons are used to obtain the scanning electron images (SEI). The number of emmited econdary electrons depends on the surface morphology of investigated specimens and thus tree-dimensional image of sample surface is created. Signal of backscattered electrons (BSE) can be also used to produce scanning electron image illustrating contrast in the composition in multiphase samples.
    The principle of EDS analysis (elemental analysis) is that the electron beam generate the X-rays within the specimen. The energy of emitted X-rays is characteristic of the chemical elements present in the sample while the intensity of the energy is proportional to the aboundance of the element in the sample.

    Radno i mjerno područje

    10-500 000 x

    Proizvođač

    Jeol

    Mrežna (URL) adresa proizvođača

    http://www.jeol.co.jp/en/

    Purchase price

    5000000

    Vijek trajanja

    20 years

    Ostale tehničke karakteristike

    Schottky Field Emission Cathode
    High resolution 1.2 nm / 20 kV, 3 nm / 5kV
    SEI (secundary electron) and BEI (backscatter electron) imiging
    EDS (Energy Dispersive X-ray) spectrometer (Oxford Instruments

    Detaljne tehničke karakteristike

    Working woltage (changable): 500 V - 20 kV
    Vacuum in sample chamber: 10-5 Pa
    Minimum working distance (WD): 4 mm
    Maximum sample size: 12 x 12 x 10 mm

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